Aiden Roy

Bian, Z., Chudak, F., Israel, R., Lackey, B., Macready, W., & Roy, A. (2016). Mapping contrained optimization problems to quantum annealing with application to fault diagnosis. Frontiers in ICT, 3, 14. http://doi.org/10.3389/fict.2016.00014 (Original work published July 2016)