Scott Schmucker

Namboodiri, P. ., Wyrick, J. ., Stan, G. ., Wang, X. ., Fei, F. ., Kashid, R. V., … Silver, R. . (2024). Multi-scale alignment to buried atom-scale devices using Kelvin probe force microscopy. Nanotechnology Reviews, 13. http://doi.org/10.1515/ntrev-2023-0196 (Original work published January 2024)