Y. Yang

Yang, Y. F., Liu, C. W., Chuang, C. S., Cheng, G. J., Walker, A. R. H., Newell, D. B., & Elmquist, R. E. (2016). Millimeter-sized Graphene Quantum Hall Devices for Resistance Standards. In .

Rigosi, A. F., Liu, C. I., . Y. Wu, B. ., . Y. Lee, H. ., Kruskopf, M. ., Yang, Y. F., … Newell, D. B. (2018). Quantum Hall device data monitoring following encapsulating polymer deposition. Data in Brief, 20, 1201–1208. http://doi.org/10.1016/j.dib.2018.08.121

Rigosi, A. F., Panna, A. R., Payagala, S. U., Jones, G. R., Kraft, M. E., Kruskopf, M. ., … Newell, D. B. (2018). A Table-Top Graphene Quantized Hall Standard. In .

Rigosi, A. F., Panna, A. R., Payagala, S. U., Kruskopf, M. ., Kraft, M. E., Jones, G. R., … Elmquist, R. E. (2019). Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. Ieee Transactions on Instrumentation and Measurement, 68, 1870–1878. http://doi.org/10.1109/tim.2018.2882958

Rigosi, A. F., Glavin, N. R., Liu, C. I., Yang, Y. F., Obrzut, J. ., Hill, H. M., … Newell, D. B. (2017). Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations. Small, 13. http://doi.org/10.1002/smll.201700452

Rigosi, A. F., Hill, H. M., Glavin, N. R., Pookpanratana, S. J., Yang, Y. F., Boosalis, A. G., … Newell, D. B. (2018). Measuring the dielectric and optical response of millimeter-scale amorphous and hexagonal boron nitride films grown on epitaxial graphene. 2d Materials, 5. http://doi.org/10.1088/2053-1583/aa9ea3

Rigosi, A. F., Liu, C. I., Glavin, N. R., Yang, Y. F., Hill, H. M., Hu, J. N., … Newell, D. B. (2017). Electrical Stabilization of Surface Resistivity in Epitaxial Graphene Systems by Amorphous Boron Nitride Encapsulation. Acs Omega, 2, 2326–2332. http://doi.org/10.1021/acsomega.7b00341

Rigosi, A. F., Liu, C. I., . Y. Wu, B. ., . Y. Lee, H. ., Kruskopf, M. ., Yang, Y. F., … Newell, D. B. (2018). Examining epitaxial graphene surface conductivity and quantum Hall device stability with Parylene passivation. Microelectronic Engineering, 194, 51–55. http://doi.org/10.1016/j.mee.2018.03.004

Panchal, V. ., Yang, Y. F., Cheng, G. J., Hu, J. N., Kruskopf, M. ., Liu, C. I., … Elmquist, R. E. (2018). Confocal laser scanning microscopy for rapid optical characterization of graphene. Communications Physics, 1. http://doi.org/10.1038/s42005-018-0084-6

Oe, T. ., Rigosi, A. F., Kruskopf, M. ., . Y. Wu, B. ., . Y. Lee, H. ., Yang, Y. F., … Jarrett, D. G. (2020). Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. Ieee Transactions on Instrumentation and Measurement, 69, 3103–3108. http://doi.org/10.1109/tim.2019.2930436