N.
M.
Zimmerman
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Huang, P. H., Zimmerman, N. M., & Bryant, G. W. (2018). Spin decoherence in a two-qubit CPHASE gate: the critical role of tunneling noise. Npj Quantum Information, 4. http://doi.org/10.1038/s41534-018-0112-0
Hu, B. H., Ochoa, E. D., Sanchez, D. ., Perron, J. K., Zimmerman, N. M., & Stewart, M. D. (2018). Effect of device design on charge offset drift in Si/SiO2 single electron devices. Journal of Applied Physics, 124. http://doi.org/10.1063/1.5048013