Name
Confocal microscopy
Copeland, C. ., Pintar, A. ., Dixson, R. ., Chanana, A. ., Srinivasan, K. ., Westly, D. A., … Stavis, S. . (2024). Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield. Optica Quantum, 2, 72–84. http://doi.org/10.1364/OPTICAQ.502464 (Original work published April 2024)
Aghaeimeibodi, S. ., Kim, J.-H. ., & Waks, E. . (2017). Near Infrared Emission from Defect States of Atomically Thin Phosphorene. In Conference on Lasers and Electro-Optics (p. SW4K.4). Optica Publishing Group. http://doi.org/10.1364/CLEO_SI.2017.SW4K.4