Keywords
Abstract
We demonstrate a new class of near infrared localized defects in few layer phosphorene. This work highlights the significance of defect states of phosphorene for near infrared optoelectronic applications.
Year of Publication
2017
Conference Name
Conference on Lasers and Electro-Optics
Publisher
Optica Publishing Group
URL
https://opg.optica.org/abstract.cfm?URI=CLEO_SI-2017-SW4K.4
DOI
10.1364/CLEO_SI.2017.SW4K.4
Group
Hero