Measurements of fractional multiples of the nu=2 plateau quantized Hall resistance (R-H approximate to 12 906 omega) were enabled by the utilization of multiple current terminals on millimetre-scale graphenep-njunction (pnJ) devices fabricated with interfaces along both lateral directions. These quantum Hall resistance checkerboard devices have been demonstrated to match quantized resistance outputs numerically calculated with the LTspice circuit simulator. From the devices functionality, more complex embodiments of the quantum Hall resistance checkerboard were simulated to highlight the parameter space within which these devices could operate. Moreover, these measurements suggest that the scalability ofpnJ fabrication on millimetre or centimetre scales is feasible with regards to graphene device manufacturing by using the far more efficient process of standard ultraviolet lithography.